The ALTEM instrument is dedicated to imaging magnetic fields and magnetic materials in a field-free region, which is critical for magnetic materials. Compared to standard magnetic imaging, aberration correction allows for enhanced spatial resolution.
The sample must be in the form of a thinned TEM sample, which can be thinned from bulk using standard techniques. Samples can be up to 3 mm diameter disks for static imaging and up to 2 mm diameter for magnetization reversal studies (in-plane applied magnetic field up to +/- 800 Gauss).
Unique, dedicated aberration-corrected LTEM with high spatial resolution for imaging magnetic domain structure with up to 2 nm spatial resolution and microstructure with up to 0.4 nm spatial resolution in a field-free region. In addition to magnetizing, the ALTEM's capabilities include tomography, heating and cooling stages, and an electron biprism.
The instrument is used by a single group at ANL and does not reside in a user facility.
Dr. Amanda Petford-Long, email@example.com, 630-252-5481
- 'In-situ Lorentz TEM magnetization studies of a Ni-Mn-Ga ferromagnetic shape memory alloy,' A. Budruk, C. Phatak, A.K. Petford-Long, M. De Graef, Acta Mat. 59, 4895_4906 (2011).
- 'In-situ Lorentz TEM magnetization studies on a Fe-Pd-Co martensitic alloy,' A. Budruk, C. Phatak, A.K. Petford-Long, M. De Graef, Acta Mat. 59, 6646_6657 (2011).
- 'Ferromagnetic domain behavior and phase transition in bilayer manganites investigated at the nanoscale,' C. Phatak, A.K. Petford-Long, H. Zheng, J.F. Mitchell, S. Rosenkranz, M. Norman, Phys. Rev B 92, 224418 (2015). DOI: 10.1103/PhysRevB.92.224418.
- 'Nanoscale skyrmions in a non-chiral metallic multiferroic: Ni2MnGa,' C. Phatak, O. Heinonen, M. De Graef, A. Petford-Long, Nano Lett. (2016) DOI: 10.1021/acs.nanolett.6b01011.